1. 11 Jul, 2016 1 commit
  2. 05 Apr, 2015 1 commit
    • Richard Weinberger's avatar
      mtd: Make MTD tests cancelable · 2a6a28e7
      Richard Weinberger authored
      I always go nuts when I start an MTD test on a slow device and have to
      wait forever until it finishes. From the debug output I already know
      what the issue is but I have to wait or reset the board hard. Resetting
      is often not an option (remote access, you don't want lose the current
      state, etc...).
      The solution is easy, check for pending signals at key positions in the
      code. Using that one can even stop a test by pressing CTRL-C as
      insmod/modprobe have SIGINT pending.
      Signed-off-by: default avatarRichard Weinberger <richard@nod.at>
      Signed-off-by: default avatarBrian Norris <computersforpeace@gmail.com>
  3. 19 Aug, 2014 1 commit
  4. 27 Oct, 2013 1 commit
  5. 30 Aug, 2013 3 commits
  6. 15 Nov, 2012 1 commit
  7. 29 Sep, 2012 1 commit
    • Iwo Mergler's avatar
      mtd: tests: test for multi-bit error correction · 3cf06f4f
      Iwo Mergler authored
      This tests ECC biterror recovery on a single NAND page. Mostly intended
      to test ECC hardware and low-level NAND driver.
      There are two test modes:
          0 - artificially inserting bit errors until the ECC fails
              This is the default method and fairly quick. It should
              be independent of the quality of the FLASH.
          1 - re-writing the same pattern repeatedly until the ECC fails.
              This method relies on the physics of NAND FLASH to eventually
              generate '0' bits if '1' has been written sufficient times. Depending
              on the NAND, the first bit errors will appear after 1000 or
              more writes and then will usually snowball, reaching the limits
              of the ECC quickly.
      The test stops after 10000 cycles, should your FLASH be exceptionally
      good and not generate bit errors before that. Try a different page
      offset in that case.
      Please note that neither of these tests will significantly 'use up' any FLASH
      endurance. Only a maximum of two erase operations will be performed.
      Signed-off-by: default avatarIwo Mergler <Iwo.Mergler@netcommwireless.com.au>
      Signed-off-by: default avatarArtem Bityutskiy <artem.bityutskiy@linux.intel.com>
      Signed-off-by: default avatarDavid Woodhouse <David.Woodhouse@intel.com>